Influence of ő≥-ray total dose radiation effect on the hot carrier gate current of the uniaxial strained Si nano-scale NMOSFET.
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Influence of ő≥-ray total dose radiation effect on the hot carrier gate current of the uniaxial strained Si nano-scale NMOSFET.
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Influence of ő≥-ray total dose radiation effect on the hot carrier gate current of the uniaxial strained Si nano-scale NMOSFET.
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