Reliability aspects of copper metallization and interconnect technology for power devices.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/mr/HilleRSSHBGCRUK16
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mr/HilleRSSHBGCRUK16
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Alexander_Ciliox
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Carsten_Sch%E2%88%9A%C2%A7ffer
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Daniel_Bolowski
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Frank_Hille
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Frank_Umbach
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Holger_Schulze
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Karina_Rott
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Karsten_Guth
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Martin_Kerber
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Nicolas_Heuck
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Roman_Roth
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2016.07.119
>
foaf:
homepage
<
https://doi.org/10.1016/j.microrel.2016.07.119
>
dc:
identifier
DBLP journals/mr/HilleRSSHBGCRUK16
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2Fj.microrel.2016.07.119
(xsd:string)
dcterms:
issued
2016
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mr
>
rdfs:
label
Reliability aspects of copper metallization and interconnect technology for power devices.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Alexander_Ciliox
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Carsten_Sch%E2%88%9A%C2%A7ffer
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Daniel_Bolowski
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Frank_Hille
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Frank_Umbach
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Holger_Schulze
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Karina_Rott
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Karsten_Guth
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Martin_Kerber
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Nicolas_Heuck
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Roman_Roth
>
swrc:
pages
393-402
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mr/HilleRSSHBGCRUK16/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mr/HilleRSSHBGCRUK16
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mr/mr64.html#HilleRSSHBGCRUK16
>
rdfs:
seeAlso
<
https://doi.org/10.1016/j.microrel.2016.07.119
>
dc:
title
Reliability aspects of copper metallization and interconnect technology for power devices.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
64
(xsd:string)