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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/HilleRSSHBGCRUK16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alexander_Ciliox>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Carsten_Sch%E2%88%9A%C2%A7ffer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daniel_Bolowski>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Frank_Hille>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Frank_Umbach>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Holger_Schulze>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Karina_Rott>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Karsten_Guth>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Martin_Kerber>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nicolas_Heuck>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Roman_Roth>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2016.07.119>
foaf:homepage <https://doi.org/10.1016/j.microrel.2016.07.119>
dc:identifier DBLP journals/mr/HilleRSSHBGCRUK16 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2016.07.119 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Reliability aspects of copper metallization and interconnect technology for power devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alexander_Ciliox>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Carsten_Sch%E2%88%9A%C2%A7ffer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daniel_Bolowski>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Frank_Hille>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Frank_Umbach>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Holger_Schulze>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Karina_Rott>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Karsten_Guth>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Martin_Kerber>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nicolas_Heuck>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Roman_Roth>
swrc:pages 393-402 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/HilleRSSHBGCRUK16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/HilleRSSHBGCRUK16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr64.html#HilleRSSHBGCRUK16>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2016.07.119>
dc:title Reliability aspects of copper metallization and interconnect technology for power devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 64 (xsd:string)