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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/IzuddinKNS12>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anis_Nurashikin_Nordin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/I._Izuddin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._H._Kamaruddin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Norhayati_Soin>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2012.06.118>
foaf:homepage <https://doi.org/10.1016/j.microrel.2012.06.118>
dc:identifier DBLP journals/mr/IzuddinKNS12 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2012.06.118 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Trench DMOS interface trap characterization by three-terminal charge pumping measurement. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anis_Nurashikin_Nordin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/I._Izuddin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._H._Kamaruddin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Norhayati_Soin>
swrc:number 12 (xsd:string)
swrc:pages 2914-2919 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/IzuddinKNS12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/IzuddinKNS12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr52.html#IzuddinKNS12>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2012.06.118>
dc:title Trench DMOS interface trap characterization by three-terminal charge pumping measurement. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 52 (xsd:string)