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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/JiXLTL16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Feng_Ji>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jing-Ping_Xu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lu_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pui_To_Lai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wing_Man_Tang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2015.12.004>
foaf:homepage <https://doi.org/10.1016/j.microrel.2015.12.004>
dc:identifier DBLP journals/mr/JiXLTL16 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2015.12.004 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label A 2-D analytical threshold-voltage model for GeOI/GeON MOSFET with high-k gate dielectric. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Feng_Ji>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jing-Ping_Xu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lu_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pui_To_Lai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wing_Man_Tang>
swrc:pages 24-33 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/JiXLTL16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/JiXLTL16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr57.html#JiXLTL16>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2015.12.004>
dc:title A 2-D analytical threshold-voltage model for GeOI/GeON MOSFET with high-k gate dielectric. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 57 (xsd:string)