A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Dimitri_Linten>
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foaf:homepage	<http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2017.11.022>
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foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Francky_Catthoor>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Gerhard_Rzepa>
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swrc:pages	186-194 (xsd:string)
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dc:title	A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability. (xsd:string)
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