[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/KhanLBBL17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chul_Seung_Lim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/GeunYong_Bak>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sanghyeon_Baeg>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Saqib_A._Khan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Soonyoung_Lee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2016.12.004>
foaf:homepage <https://doi.org/10.1016/j.microrel.2016.12.004>
dc:identifier DBLP journals/mr/KhanLBBL17 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2016.12.004 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chul_Seung_Lim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/GeunYong_Bak>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sanghyeon_Baeg>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Saqib_A._Khan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Soonyoung_Lee>
swrc:pages 100-108 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/KhanLBBL17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/KhanLBBL17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr69.html#KhanLBBL17>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2016.12.004>
dc:title An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 69 (xsd:string)