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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/KimLKLSL18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gang-Jun_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jongkyun_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jung-Eun_Seok>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Namhyun_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Young-Yun_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yunsung_Lee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2018.06.101>
foaf:homepage <https://doi.org/10.1016/j.microrel.2018.06.101>
dc:identifier DBLP journals/mr/KimLKLSL18 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2018.06.101 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gang-Jun_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jongkyun_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jung-Eun_Seok>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Namhyun_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Young-Yun_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yunsung_Lee>
swrc:pages 183-185 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/KimLKLSL18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/KimLKLSL18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr88.html#KimLKLSL18>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2018.06.101>
dc:title Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 88-90 (xsd:string)