Drain current saturation at high drain voltage due to pinch off instead of velocity saturation in sub-100 nm metal-oxide-semiconductor transistors. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/journals/mr/LauYCHLSC09>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/C._H._Loh>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Jason_Zhiwei_Chian>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/L._Chan>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Peizhen_Yang>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/S._Y._Siah>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/V._Ho>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/W._S._Lau>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2008.10.006>
foaf:homepage	<https://doi.org/10.1016/j.microrel.2008.10.006>
dc:identifier	DBLP journals/mr/LauYCHLSC09 (xsd:string)
dc:identifier	DOI doi.org%2F10.1016%2Fj.microrel.2008.10.006 (xsd:string)
dcterms:issued	2009 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label	Drain current saturation at high drain voltage due to pinch off instead of velocity saturation in sub-100 nm metal-oxide-semiconductor transistors. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/C._H._Loh>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Jason_Zhiwei_Chian>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/L._Chan>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Peizhen_Yang>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/S._Y._Siah>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/V._Ho>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/W._S._Lau>
swrc:number	1 (xsd:string)
swrc:pages	1-7 (xsd:string)
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/journals/mr/LauYCHLSC09/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/journals/mr/LauYCHLSC09>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/mr/mr49.html#LauYCHLSC09>
rdfs:seeAlso	<https://doi.org/10.1016/j.microrel.2008.10.006>
dc:title	Drain current saturation at high drain voltage due to pinch off instead of velocity saturation in sub-100 nm metal-oxide-semiconductor transistors. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:Article
rdf:type	foaf:Document
swrc:volume	49 (xsd:string)