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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/LeeKKKSSK13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bongkoo_Kang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheolgyu_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Donghee_Son>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gang-Jun_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hyeokjin_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ji-Hoon_Seo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seonhaeng_Lee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2013.07.026>
foaf:homepage <https://doi.org/10.1016/j.microrel.2013.07.026>
dc:identifier DBLP journals/mr/LeeKKKSSK13 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2013.07.026 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Effect of negative bias temperature instability induced by a low stress voltage on nanoscale high-k/metal gate pMOSFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bongkoo_Kang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheolgyu_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Donghee_Son>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gang-Jun_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hyeokjin_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ji-Hoon_Seo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seonhaeng_Lee>
swrc:number 9-11 (xsd:string)
swrc:pages 1351-1354 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/LeeKKKSSK13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/LeeKKKSSK13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr53.html#LeeKKKSSK13>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2013.07.026>
dc:title Effect of negative bias temperature instability induced by a low stress voltage on nanoscale high-k/metal gate pMOSFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 53 (xsd:string)