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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/MartinVMTBN16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Mitchell>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andreas_Martin_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/D._Beckmeier>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._Nielen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Traving>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rolf-Peter_Vollertsen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2016.07.120>
foaf:homepage <https://doi.org/10.1016/j.microrel.2016.07.120>
dc:identifier DBLP journals/mr/MartinVMTBN16 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2016.07.120 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Fast wafer level reliability monitoring as a tool to achieve automotive quality for a wafer process. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Mitchell>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andreas_Martin_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/D._Beckmeier>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._Nielen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Traving>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rolf-Peter_Vollertsen>
swrc:pages 2-12 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/MartinVMTBN16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/MartinVMTBN16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr64.html#MartinVMTBN16>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2016.07.120>
dc:title Fast wafer level reliability monitoring as a tool to achieve automotive quality for a wafer process. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 64 (xsd:string)