[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/MessarisKFTNGD16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C._A._Dimitriadis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christoforos_G._Theodorou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/G%E2%88%9A%C2%A9rard_Ghibaudo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ioannis_Messaris>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nikolaos_Fasarakis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Spiros_Nikolaidis_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Theano_A._Karatsori>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2015.11.002>
foaf:homepage <https://doi.org/10.1016/j.microrel.2015.11.002>
dc:identifier DBLP journals/mr/MessarisKFTNGD16 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2015.11.002 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C._A._Dimitriadis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christoforos_G._Theodorou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/G%E2%88%9A%C2%A9rard_Ghibaudo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ioannis_Messaris>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nikolaos_Fasarakis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Spiros_Nikolaidis_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Theano_A._Karatsori>
swrc:pages 10-16 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/MessarisKFTNGD16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/MessarisKFTNGD16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr56.html#MessarisKFTNGD16>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2015.11.002>
dc:title Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 56 (xsd:string)