Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique.
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bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mr/MoschouEKPAV08
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Aggeliki_Arapoyanni
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Apostolos_T._Voutsas
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Despina_C._Moschou
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Dimitrios_N._Kouvatsos
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/George_J._Papaioannou
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/M._A._Exarchos
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2008.06.006
>
foaf:
homepage
<
https://doi.org/10.1016/j.microrel.2008.06.006
>
dc:
identifier
DBLP journals/mr/MoschouEKPAV08
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2Fj.microrel.2008.06.006
(xsd:string)
dcterms:
issued
2008
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mr
>
rdfs:
label
Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Aggeliki_Arapoyanni
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Apostolos_T._Voutsas
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Despina_C._Moschou
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Dimitrios_N._Kouvatsos
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/George_J._Papaioannou
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/M._A._Exarchos
>
swrc:
number
8-9
(xsd:string)
swrc:
pages
1544-1548
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mr/MoschouEKPAV08/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mr/MoschouEKPAV08
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mr/mr48.html#MoschouEKPAV08
>
rdfs:
seeAlso
<
https://doi.org/10.1016/j.microrel.2008.06.006
>
dc:
title
Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
48
(xsd:string)