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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/NeoQANMTSCML17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alfred_C._T._Quah>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C._W._Soo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Changqing_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dayanand_Nagalingam>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ghim_Boon_Ang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hnin_Hnin_Ma>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeffrey_Lam>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Siong_Luong_Ting>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Soh_Ping_Neo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhihong_Mai>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2017.07.036>
foaf:homepage <https://doi.org/10.1016/j.microrel.2017.07.036>
dc:identifier DBLP journals/mr/NeoQANMTSCML17 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2017.07.036 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alfred_C._T._Quah>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C._W._Soo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Changqing_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dayanand_Nagalingam>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ghim_Boon_Ang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hnin_Hnin_Ma>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jeffrey_Lam>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Siong_Luong_Ting>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Soh_Ping_Neo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhihong_Mai>
swrc:pages 255-260 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/NeoQANMTSCML17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/NeoQANMTSCML17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr76.html#NeoQANMTSCML17>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2017.07.036>
dc:title Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 76-77 (xsd:string)