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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/NguyenJLCR11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/G._Chaplier>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lionel_Rousseau>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pierre-Yves_Joubert>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/St%E2%88%9A%C2%A9phane_Lefebvre>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tien_Anh_Nguyen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2011.02.002>
foaf:homepage <https://doi.org/10.1016/j.microrel.2011.02.002>
dc:identifier DBLP journals/mr/NguyenJLCR11 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2011.02.002 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Study for the non-contact characterization of metallization ageing of power electronic semiconductor devices using the eddy current technique. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/G._Chaplier>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lionel_Rousseau>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pierre-Yves_Joubert>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/St%E2%88%9A%C2%A9phane_Lefebvre>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tien_Anh_Nguyen>
swrc:number 6 (xsd:string)
swrc:pages 1127-1135 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/NguyenJLCR11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/NguyenJLCR11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr51.html#NguyenJLCR11>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2011.02.002>
dc:title Study for the non-contact characterization of metallization ageing of power electronic semiconductor devices using the eddy current technique. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 51 (xsd:string)