TCAD simulation of radiation-induced leakage current in 1T1C SDRAM.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/mr/NguyenRWMBCV18
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mr/NguyenRWMBCV18
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Alain_Michez
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Axel_Rodriguez
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Benjamin_Vandevelde
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Francoise_Bezerra
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Frederic_Wrobel
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hoang_T._Nguyen
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Nathalie_Chatry
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2018.07.094
>
foaf:
homepage
<
https://doi.org/10.1016/j.microrel.2018.07.094
>
dc:
identifier
DBLP journals/mr/NguyenRWMBCV18
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2Fj.microrel.2018.07.094
(xsd:string)
dcterms:
issued
2018
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mr
>
rdfs:
label
TCAD simulation of radiation-induced leakage current in 1T1C SDRAM.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Alain_Michez
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Axel_Rodriguez
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Benjamin_Vandevelde
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Francoise_Bezerra
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Frederic_Wrobel
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hoang_T._Nguyen
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Nathalie_Chatry
>
swrc:
pages
974-978
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mr/NguyenRWMBCV18/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mr/NguyenRWMBCV18
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mr/mr88.html#NguyenRWMBCV18
>
rdfs:
seeAlso
<
https://doi.org/10.1016/j.microrel.2018.07.094
>
dc:
title
TCAD simulation of radiation-induced leakage current in 1T1C SDRAM.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
88-90
(xsd:string)