Topological variation on sub-20‚ÄĮnm double-gate inversion and Junctionless-FinFET based 6T-SRAM circuits and its SEU radiation performance.
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Topological variation on sub-20‚ÄĮnm double-gate inversion and Junctionless-FinFET based 6T-SRAM circuits and its SEU radiation performance.
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