Comparison study on performances and robustness between SiC MOSFET & JFET devices - Abilities for aeronautics application.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/mr/OthmanBLIKB12
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mr/OthmanBLIKB12
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/A._Bouzourene
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ali_Ibrahim
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/D._Othman
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/M._Bouarroudj-Berkani
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/St%E2%88%9A%C2%A9phane_Lefebvre
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Zoubir_Khatir
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2012.06.078
>
foaf:
homepage
<
https://doi.org/10.1016/j.microrel.2012.06.078
>
dc:
identifier
DBLP journals/mr/OthmanBLIKB12
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2Fj.microrel.2012.06.078
(xsd:string)
dcterms:
issued
2012
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mr
>
rdfs:
label
Comparison study on performances and robustness between SiC MOSFET & JFET devices - Abilities for aeronautics application.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/A._Bouzourene
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ali_Ibrahim
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/D._Othman
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/M._Bouarroudj-Berkani
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/St%E2%88%9A%C2%A9phane_Lefebvre
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Zoubir_Khatir
>
swrc:
number
9-10
(xsd:string)
swrc:
pages
1859-1864
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mr/OthmanBLIKB12/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mr/OthmanBLIKB12
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mr/mr52.html#OthmanBLIKB12
>
rdfs:
seeAlso
<
https://doi.org/10.1016/j.microrel.2012.06.078
>
dc:
title
Comparison study on performances and robustness between SiC MOSFET & JFET devices - Abilities for aeronautics application.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
52
(xsd:string)