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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/PolingVBJM17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/B._S._Poling>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/E._E._Johnson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Glen_David_Via>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._M._McDermott>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/K._D._Bole>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2016.09.017>
foaf:homepage <https://doi.org/10.1016/j.microrel.2016.09.017>
dc:identifier DBLP journals/mr/PolingVBJM17 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2016.09.017 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Commercial-off-the-shelf algan/gan hemt device reliability study after exposure to heavy ion radiation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/B._S._Poling>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/E._E._Johnson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Glen_David_Via>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._M._McDermott>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/K._D._Bole>
swrc:pages 13-20 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/PolingVBJM17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/PolingVBJM17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr68.html#PolingVBJM17>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2016.09.017>
dc:title Commercial-off-the-shelf algan/gan hemt device reliability study after exposure to heavy ion radiation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 68 (xsd:string)