[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/PoshtanRSW16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bernhard_Wunderle>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Silber>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Emad_A._Poshtan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sven_Rzepka>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2016.03.017>
foaf:homepage <https://doi.org/10.1016/j.microrel.2016.03.017>
dc:identifier DBLP journals/mr/PoshtanRSW16 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2016.03.017 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label An in-situ numerical-experimental approach for fatigue delamination characterization in microelectronic packages. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bernhard_Wunderle>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Silber>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Emad_A._Poshtan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sven_Rzepka>
swrc:pages 18-25 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/PoshtanRSW16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/PoshtanRSW16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr62.html#PoshtanRSW16>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2016.03.017>
dc:title An in-situ numerical-experimental approach for fatigue delamination characterization in microelectronic packages. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 62 (xsd:string)