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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/Rey-TauriacSTB03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Taurin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Olivier_Bonnaud>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Olivier_de_Sagazan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yannick_Rey-Tauriac>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2FS0026-2714%2803%2900317-2>
foaf:homepage <https://doi.org/10.1016/S0026-2714(03)00317-2>
dc:identifier DBLP journals/mr/Rey-TauriacSTB03 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2FS0026-2714%2803%2900317-2 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Taurin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Olivier_Bonnaud>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Olivier_de_Sagazan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yannick_Rey-Tauriac>
swrc:number 9-11 (xsd:string)
swrc:pages 1865-1869 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/Rey-TauriacSTB03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/Rey-TauriacSTB03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr43.html#Rey-TauriacSTB03>
rdfs:seeAlso <https://doi.org/10.1016/S0026-2714(03)00317-2>
dc:title Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 43 (xsd:string)