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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/RigatoFHCSP15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cl%E2%88%9A%C2%A9ment_Fleury>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dionyz_Pogany>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matteo_Rigato>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mattia_Capriotti>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Heer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Werner_Simb%E2%88%9A%C4%BErger>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2015.06.019>
foaf:homepage <https://doi.org/10.1016/j.microrel.2015.06.019>
dc:identifier DBLP journals/mr/RigatoFHCSP15 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2015.06.019 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label ESD characterization of multi-finger RF nMOSFET transistors by TLP and transient interferometric mapping technique. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cl%E2%88%9A%C2%A9ment_Fleury>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dionyz_Pogany>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matteo_Rigato>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mattia_Capriotti>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Heer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Werner_Simb%E2%88%9A%C4%BErger>
swrc:number 9-10 (xsd:string)
swrc:pages 1471-1475 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2015.06.019>
dc:title ESD characterization of multi-finger RF nMOSFET transistors by TLP and transient interferometric mapping technique. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 55 (xsd:string)