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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/Rodriguez-Fernandez18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alberto_Rodriguez-Fernandez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Enrique_Miranda_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._Mu%E2%88%9A%C4%AAoz-Gorriz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jordi_Su%E2%88%9A%C4%AA%E2%88%9A%C2%A9>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2018.06.120>
foaf:homepage <https://doi.org/10.1016/j.microrel.2018.06.120>
dc:identifier DBLP journals/mr/Rodriguez-Fernandez18 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2018.06.120 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alberto_Rodriguez-Fernandez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Enrique_Miranda_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._Mu%E2%88%9A%C4%AAoz-Gorriz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jordi_Su%E2%88%9A%C4%AA%E2%88%9A%C2%A9>
swrc:pages 142-146 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2018.06.120>
dc:title A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 88-90 (xsd:string)