New insights on the PBTI phenomena in SiON pMOSFETs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/mr/RottRASKGG12
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mr/RottRASKGG12
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Christian_Schl%E2%88%9A%C4%BEnder
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hans_Reisinger
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Karina_Rott
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Klaus_K%E2%88%9A%E2%88%82lpin
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Stefano_Aresu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Tibor_Grasser
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Wolfgang_Gustin
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2012.06.015
>
foaf:
homepage
<
https://doi.org/10.1016/j.microrel.2012.06.015
>
dc:
identifier
DBLP journals/mr/RottRASKGG12
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2Fj.microrel.2012.06.015
(xsd:string)
dcterms:
issued
2012
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mr
>
rdfs:
label
New insights on the PBTI phenomena in SiON pMOSFETs.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Christian_Schl%E2%88%9A%C4%BEnder
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hans_Reisinger
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Karina_Rott
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Klaus_K%E2%88%9A%E2%88%82lpin
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Stefano_Aresu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Tibor_Grasser
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Wolfgang_Gustin
>
swrc:
number
9-10
(xsd:string)
swrc:
pages
1891-1894
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mr/RottRASKGG12/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mr/RottRASKGG12
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mr/mr52.html#RottRASKGG12
>
rdfs:
seeAlso
<
https://doi.org/10.1016/j.microrel.2012.06.015
>
dc:
title
New insights on the PBTI phenomena in SiON pMOSFETs.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
52
(xsd:string)