A Built-In Self-Test (BIST) system with non-intrusive TPG and ORA for FPGA test and diagnosis.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/mr/RuanKWHZLL13
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mr/RuanKWHZLL13
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Aiwu_Ruan
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Peng_Li
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shi_Kang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Xiao_Han
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yongbo_Liao
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yu_Wang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Zujian_Zhu
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2012.09.013
>
foaf:
homepage
<
https://doi.org/10.1016/j.microrel.2012.09.013
>
dc:
identifier
DBLP journals/mr/RuanKWHZLL13
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2Fj.microrel.2012.09.013
(xsd:string)
dcterms:
issued
2013
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mr
>
rdfs:
label
A Built-In Self-Test (BIST) system with non-intrusive TPG and ORA for FPGA test and diagnosis.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Aiwu_Ruan
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Peng_Li
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shi_Kang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Xiao_Han
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yongbo_Liao
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yu_Wang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Zujian_Zhu
>
swrc:
number
3
(xsd:string)
swrc:
pages
488-498
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mr/RuanKWHZLL13/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mr/RuanKWHZLL13
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mr/mr53.html#RuanKWHZLL13
>
rdfs:
seeAlso
<
https://doi.org/10.1016/j.microrel.2012.09.013
>
dc:
title
A Built-In Self-Test (BIST) system with non-intrusive TPG and ORA for FPGA test and diagnosis.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
53
(xsd:string)