Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/mr/SabbahAABTM17
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Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling.
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Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling.
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