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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/SasakiHKOOOTY18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eiji_Taguchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hajime_Sasaki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hidehiro_Yasuda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaoru_Kadoiwa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shinobu_Onoda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takayuki_Hisaka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Ohshima>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tomoki_Oku>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2017.10.005>
foaf:homepage <https://doi.org/10.1016/j.microrel.2017.10.005>
dc:identifier DBLP journals/mr/SasakiHKOOOTY18 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2017.10.005 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Ultra-high voltage electron microscopy investigation of irradiation induced displacement defects on AlGaN/GaN HEMTs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eiji_Taguchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hajime_Sasaki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hidehiro_Yasuda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaoru_Kadoiwa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shinobu_Onoda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takayuki_Hisaka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Ohshima>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tomoki_Oku>
swrc:pages 312-319 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/SasakiHKOOOTY18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/SasakiHKOOOTY18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr81.html#SasakiHKOOOTY18>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2017.10.005>
dc:title Ultra-high voltage electron microscopy investigation of irradiation induced displacement defects on AlGaN/GaN HEMTs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 81 (xsd:string)