Improved estimation of the resistivity of pure copper and electrical determination of thin copper film dimensions.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/mr/SchusterVS01
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mr/SchusterVS01
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Constance_E._Schuster
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Harry_A._Schafft
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mark_G._Vangel
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2FS0026-2714%2800%2900227-4
>
foaf:
homepage
<
https://doi.org/10.1016/S0026-2714(00)00227-4
>
dc:
identifier
DBLP journals/mr/SchusterVS01
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2FS0026-2714%2800%2900227-4
(xsd:string)
dcterms:
issued
2001
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mr
>
rdfs:
label
Improved estimation of the resistivity of pure copper and electrical determination of thin copper film dimensions.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Constance_E._Schuster
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Harry_A._Schafft
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mark_G._Vangel
>
swrc:
number
2
(xsd:string)
swrc:
pages
239-252
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mr/SchusterVS01/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mr/SchusterVS01
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mr/mr41.html#SchusterVS01
>
rdfs:
seeAlso
<
https://doi.org/10.1016/S0026-2714(00)00227-4
>
dc:
title
Improved estimation of the resistivity of pure copper and electrical determination of thin copper film dimensions.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
41
(xsd:string)