Evaluation of STI degradation using temperature dependence of leakage current in parasitic STI MOSFET.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/mr/SemenovOS04
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mr/SemenovOS04
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Manoj_Sachdev
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Michael_S._Obrecht
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Oleg_Semenov
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2004.07.068
>
foaf:
homepage
<
https://doi.org/10.1016/j.microrel.2004.07.068
>
dc:
identifier
DBLP journals/mr/SemenovOS04
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2Fj.microrel.2004.07.068
(xsd:string)
dcterms:
issued
2004
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mr
>
rdfs:
label
Evaluation of STI degradation using temperature dependence of leakage current in parasitic STI MOSFET.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Manoj_Sachdev
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Michael_S._Obrecht
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Oleg_Semenov
>
swrc:
number
9-11
(xsd:string)
swrc:
pages
1751-1755
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mr/SemenovOS04/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mr/SemenovOS04
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mr/mr44.html#SemenovOS04
>
rdfs:
seeAlso
<
https://doi.org/10.1016/j.microrel.2004.07.068
>
dc:
title
Evaluation of STI degradation using temperature dependence of leakage current in parasitic STI MOSFET.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
44
(xsd:string)