Thermal reliability investigation of Ag-Sn TLP bonds for high-temperature power electronics application.
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mr/ShaoWBZZL18
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Aiping_Wu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Guisheng_Zou
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Huakai_Shao
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Lei_Liu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yudian_Bao
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yue_Zhao
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2018.08.004
>
foaf:
homepage
<
https://doi.org/10.1016/j.microrel.2018.08.004
>
dc:
identifier
DBLP journals/mr/ShaoWBZZL18
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2Fj.microrel.2018.08.004
(xsd:string)
dcterms:
issued
2018
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mr
>
rdfs:
label
Thermal reliability investigation of Ag-Sn TLP bonds for high-temperature power electronics application.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Aiping_Wu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Guisheng_Zou
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Huakai_Shao
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Lei_Liu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yudian_Bao
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yue_Zhao
>
swrc:
pages
38-45
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mr/ShaoWBZZL18/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mr/ShaoWBZZL18
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mr/mr91.html#ShaoWBZZL18
>
rdfs:
seeAlso
<
https://doi.org/10.1016/j.microrel.2018.08.004
>
dc:
title
Thermal reliability investigation of Ag-Sn TLP bonds for high-temperature power electronics application.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
91
(xsd:string)