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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/SongJKKPKKLK05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/E._Y._Kang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Heung-Jin_Joo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hyun-Ho_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jung-Hoon_Park>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kinam_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seung-Kuk_Kang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sung-Young_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Y._M._Kang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoon-Jong_Song>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2004.08.014>
foaf:homepage <https://doi.org/10.1016/j.microrel.2004.08.014>
dc:identifier DBLP journals/mr/SongJKKPKKLK05 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2004.08.014 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Electrical properties of highly reliable 32Mb FRAM with advanced capacitor technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/E._Y._Kang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Heung-Jin_Joo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hyun-Ho_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jung-Hoon_Park>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kinam_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seung-Kuk_Kang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sung-Young_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Y._M._Kang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoon-Jong_Song>
swrc:number 7-8 (xsd:string)
swrc:pages 1150-1153 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/SongJKKPKKLK05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/SongJKKPKKLK05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr45.html#SongJKKPKKLK05>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2004.08.014>
dc:title Electrical properties of highly reliable 32Mb FRAM with advanced capacitor technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 45 (xsd:string)