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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/SongKPKSCKH04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bum-Suk_Kye>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Choong-Kyun_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dong-Soo_Cho>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gab-soo_Han>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeongil_Seo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Moo-Young_Park>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Taek-Soo_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yong-Ha_Song>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2004.07.093>
foaf:homepage <https://doi.org/10.1016/j.microrel.2004.07.093>
dc:identifier DBLP journals/mr/SongKPKSCKH04 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2004.07.093 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label A study of an abnormal ESD failure mechanism and threshold voltage caused by ESD current zapping sequence. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bum-Suk_Kye>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Choong-Kyun_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dong-Soo_Cho>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gab-soo_Han>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jeongil_Seo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Moo-Young_Park>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Taek-Soo_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yong-Ha_Song>
swrc:number 9-11 (xsd:string)
swrc:pages 1829-1834 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/SongKPKSCKH04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/SongKPKSCKH04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr44.html#SongKPKSCKH04>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2004.07.093>
dc:title A study of an abnormal ESD failure mechanism and threshold voltage caused by ESD current zapping sequence. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 44 (xsd:string)