Property | Value |
dcterms:bibliographicCitation
|
<http://dblp.uni-trier.de/rec/bibtex/journals/mr/Stojcev04c>
|
dc:creator
|
<https://dblp.l3s.de/d2r/resource/authors/Mile_K._Stojcev>
|
foaf:homepage
|
<http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2003.12.010>
|
foaf:homepage
|
<https://doi.org/10.1016/j.microrel.2003.12.010>
|
dc:identifier
|
DBLP journals/mr/Stojcev04c
(xsd:string)
|
dc:identifier
|
DOI doi.org%2F10.1016%2Fj.microrel.2003.12.010
(xsd:string)
|
dcterms:issued
|
2004
(xsd:gYear)
|
swrc:journal
|
<https://dblp.l3s.de/d2r/resource/journals/mr>
|
rdfs:label
|
Power-Constrained Testing of VLSI Circuits. Nikola Nikolici, Bashir M. Al-Hashimi. Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 178, plus XI, ISBN 1-4020-7235-X.
(xsd:string)
|
foaf:maker
|
<https://dblp.l3s.de/d2r/resource/authors/Mile_K._Stojcev>
|
swrc:number
|
3
(xsd:string)
|
swrc:pages
|
547-548
(xsd:string)
|
owl:sameAs
|
<http://bibsonomy.org/uri/bibtexkey/journals/mr/Stojcev04c/dblp>
|
owl:sameAs
|
<http://dblp.rkbexplorer.com/id/journals/mr/Stojcev04c>
|
rdfs:seeAlso
|
<http://dblp.uni-trier.de/db/journals/mr/mr44.html#Stojcev04c>
|
rdfs:seeAlso
|
<https://doi.org/10.1016/j.microrel.2003.12.010>
|
dc:title
|
Power-Constrained Testing of VLSI Circuits. Nikola Nikolici, Bashir M. Al-Hashimi. Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 178, plus XI, ISBN 1-4020-7235-X.
(xsd:string)
|
dc:type
|
<http://purl.org/dc/dcmitype/Text>
|
rdf:type
|
swrc:Article
|
rdf:type
|
foaf:Document
|
swrc:volume
|
44
(xsd:string)
|