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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mile_K._Stojcev>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2003.12.010>
foaf:homepage <https://doi.org/10.1016/j.microrel.2003.12.010>
dc:identifier DBLP journals/mr/Stojcev04c (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2003.12.010 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Power-Constrained Testing of VLSI Circuits. Nikola Nikolici, Bashir M. Al-Hashimi. Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 178, plus XI, ISBN 1-4020-7235-X. (xsd:string)
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swrc:number 3 (xsd:string)
swrc:pages 547-548 (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr44.html#Stojcev04c>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2003.12.010>
dc:title Power-Constrained Testing of VLSI Circuits. Nikola Nikolici, Bashir M. Al-Hashimi. Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 178, plus XI, ISBN 1-4020-7235-X. (xsd:string)
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swrc:volume 44 (xsd:string)