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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/TallaricoRMCDGS17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andrea_Natale_Tallarico>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Claudio_Fiegna>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Enrico_Sangiorgi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giuseppe_Croce>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/P._Gattari>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Paolo_Magnone>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Riccardo_Depetro>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Susanna_Reggiani>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2017.07.043>
foaf:homepage <https://doi.org/10.1016/j.microrel.2017.07.043>
dc:identifier DBLP journals/mr/TallaricoRMCDGS17 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2017.07.043 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Investigation of the hot carrier degradation in power LDMOS transistors with customized thick oxide. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andrea_Natale_Tallarico>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Claudio_Fiegna>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Enrico_Sangiorgi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giuseppe_Croce>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/P._Gattari>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Paolo_Magnone>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Riccardo_Depetro>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Susanna_Reggiani>
swrc:pages 475-479 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/TallaricoRMCDGS17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/TallaricoRMCDGS17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr76.html#TallaricoRMCDGS17>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2017.07.043>
dc:title Investigation of the hot carrier degradation in power LDMOS transistors with customized thick oxide. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 76-77 (xsd:string)