Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/mr/TazzoliCCBM10
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Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform.
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Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform.
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