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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/TokeiLB05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/G._P._Beyer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yunlong_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zsolt_T%E2%88%9A%E2%88%82kei>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2005.07.040>
foaf:homepage <https://doi.org/10.1016/j.microrel.2005.07.040>
dc:identifier DBLP journals/mr/TokeiLB05 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2005.07.040 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Reliability challenges for copper low-k dielectrics and copper diffusion barriers. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/G._P._Beyer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yunlong_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zsolt_T%E2%88%9A%E2%88%82kei>
swrc:number 9-11 (xsd:string)
swrc:pages 1436-1442 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/TokeiLB05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/TokeiLB05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr45.html#TokeiLB05>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2005.07.040>
dc:title Reliability challenges for copper low-k dielectrics and copper diffusion barriers. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 45 (xsd:string)