Structural design optimization for board-level drop reliability of wafer-level chip-scale packages.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/mr/TsaiLYC08
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mr/TsaiLYC08
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Chang-Lin_Yeh
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Rong-Sheng_Chen
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Tsung-Yueh_Tsai
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yi-Shao_Lai
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2008.01.003
>
foaf:
homepage
<
https://doi.org/10.1016/j.microrel.2008.01.003
>
dc:
identifier
DBLP journals/mr/TsaiLYC08
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2Fj.microrel.2008.01.003
(xsd:string)
dcterms:
issued
2008
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mr
>
rdfs:
label
Structural design optimization for board-level drop reliability of wafer-level chip-scale packages.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Chang-Lin_Yeh
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Rong-Sheng_Chen
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Tsung-Yueh_Tsai
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yi-Shao_Lai
>
swrc:
number
5
(xsd:string)
swrc:
pages
757-762
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mr/TsaiLYC08/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mr/TsaiLYC08
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mr/mr48.html#TsaiLYC08
>
rdfs:
seeAlso
<
https://doi.org/10.1016/j.microrel.2008.01.003
>
dc:
title
Structural design optimization for board-level drop reliability of wafer-level chip-scale packages.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
48
(xsd:string)