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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/VogtNMB18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/B._Motamedi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Boit>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ivo_Vogt>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tomonori_Nakamura>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2018.07.012>
foaf:homepage <https://doi.org/10.1016/j.microrel.2018.07.012>
dc:identifier DBLP journals/mr/VogtNMB18 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2018.07.012 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Device characterization of 16/14‚ÄĮnm FinFETs for reliability assessment with infrared emission spectra. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/B._Motamedi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Boit>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ivo_Vogt>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tomonori_Nakamura>
swrc:pages 11-15 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/VogtNMB18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/VogtNMB18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr88.html#VogtNMB18>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2018.07.012>
dc:title Device characterization of 16/14‚ÄĮnm FinFETs for reliability assessment with infrared emission spectra. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 88-90 (xsd:string)