Erosion defect formation in Ni-gate AlGaN/GaN high electron mobility transistors.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/mr/WhitingHLPJLKRX17
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Erosion defect formation in Ni-gate AlGaN/GaN high electron mobility transistors.
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Erosion defect formation in Ni-gate AlGaN/GaN high electron mobility transistors.
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