[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/Wu18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chunlei_Wu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2018.07.011>
foaf:homepage <https://doi.org/10.1016/j.microrel.2018.07.011>
dc:identifier DBLP journals/mr/Wu18 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2018.07.011 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Electrically induced physical damage (EIPD) cases study: From electrical overstress (EOS) to product defects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chunlei_Wu>
swrc:pages 203-207 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/Wu18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/Wu18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr88.html#Wu18>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2018.07.011>
dc:title Electrically induced physical damage (EIPD) cases study: From electrical overstress (EOS) to product defects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 88-90 (xsd:string)