[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/WuLLZW16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Binhong_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chuangwei_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hongyi_Wang_0003>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jianfei_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei_Zhu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2016.07.099>
foaf:homepage <https://doi.org/10.1016/j.microrel.2016.07.099>
dc:identifier DBLP journals/mr/WuLLZW16 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2016.07.099 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Microcontroller susceptibility variations to EFT burst during accelerated aging. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Binhong_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chuangwei_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hongyi_Wang_0003>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jianfei_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei_Zhu>
swrc:pages 210-214 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/WuLLZW16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/WuLLZW16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr64.html#WuLLZW16>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2016.07.099>
dc:title Microcontroller susceptibility variations to EFT burst during accelerated aging. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 64 (xsd:string)