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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/YehCGWL13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chao-Sung_Lai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jer-Chyi_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kwang-Jow_Gan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Po-Ying_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wen-Kuan_Yeh>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2012.07.036>
foaf:homepage <https://doi.org/10.1016/j.microrel.2012.07.036>
dc:identifier DBLP journals/mr/YehCGWL13 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2012.07.036 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chao-Sung_Lai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jer-Chyi_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kwang-Jow_Gan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Po-Ying_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wen-Kuan_Yeh>
swrc:number 2 (xsd:string)
swrc:pages 265-269 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/YehCGWL13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/YehCGWL13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr53.html#YehCGWL13>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2012.07.036>
dc:title The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 53 (xsd:string)