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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/YuJDWZW16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hao_Jin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hei_Wong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jie_Zeng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shurong_Dong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Weihuai_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhihui_Yu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2015.12.024>
foaf:homepage <https://doi.org/10.1016/j.microrel.2015.12.024>
dc:identifier DBLP journals/mr/YuJDWZW16 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2015.12.024 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Comparative study of reliability degradation behaviors of LDMOS and LDMOS-SCR ESD protection devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hao_Jin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hei_Wong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jie_Zeng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shurong_Dong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Weihuai_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhihui_Yu>
swrc:pages 111-114 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/YuJDWZW16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/YuJDWZW16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr61.html#YuJDWZW16>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2015.12.024>
dc:title Comparative study of reliability degradation behaviors of LDMOS and LDMOS-SCR ESD protection devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 61 (xsd:string)