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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/ZhangKCTP08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/D._Pinjala>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kripesh_Vaidyanathan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tai_Chong_Chai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Teck_Chun_Tan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaowu_Zhang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2007.05.009>
foaf:homepage <https://doi.org/10.1016/j.microrel.2007.05.009>
dc:identifier DBLP journals/mr/ZhangKCTP08 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2007.05.009 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Board level solder joint reliability analysis of a fine pitch Cu post type wafer level package (WLP). (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/D._Pinjala>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kripesh_Vaidyanathan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tai_Chong_Chai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Teck_Chun_Tan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaowu_Zhang>
swrc:number 4 (xsd:string)
swrc:pages 602-610 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/ZhangKCTP08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/ZhangKCTP08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr48.html#ZhangKCTP08>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2007.05.009>
dc:title Board level solder joint reliability analysis of a fine pitch Cu post type wafer level package (WLP). (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 48 (xsd:string)