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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/ZhangWHCCLHLYY16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chih-Jui_Lai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chun-Hsiang_Hsu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shih-Yao_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsu-Ting_Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tzuo-Li_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wen-Kuan_Yeh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wenqi_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yan-hua_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yilin_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yiying_Li>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2016.10.015>
foaf:homepage <https://doi.org/10.1016/j.microrel.2016.10.015>
dc:identifier DBLP journals/mr/ZhangWHCCLHLYY16 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2016.10.015 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chih-Jui_Lai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chun-Hsiang_Hsu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shih-Yao_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsu-Ting_Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tzuo-Li_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wen-Kuan_Yeh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wenqi_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yan-hua_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yilin_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yiying_Li>
swrc:pages 89-93 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/ZhangWHCCLHLYY16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/ZhangWHCCLHLYY16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr67.html#ZhangWHCCLHLYY16>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2016.10.015>
dc:title Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 67 (xsd:string)