Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs.
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mr/ZhangWHCCLHLYY16
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Chih-Jui_Lai
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Chun-Hsiang_Hsu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shih-Yao_Chen
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Tsu-Ting_Cheng
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Tzuo-Li_Wang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Wen-Kuan_Yeh
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Wenqi_Zhang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yan-hua_Huang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yilin_Yang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yiying_Li
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2016.10.015
>
foaf:
homepage
<
https://doi.org/10.1016/j.microrel.2016.10.015
>
dc:
identifier
DBLP journals/mr/ZhangWHCCLHLYY16
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2Fj.microrel.2016.10.015
(xsd:string)
dcterms:
issued
2016
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mr
>
rdfs:
label
Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Chih-Jui_Lai
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Chun-Hsiang_Hsu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shih-Yao_Chen
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Tsu-Ting_Cheng
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Tzuo-Li_Wang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Wen-Kuan_Yeh
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Wenqi_Zhang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yan-hua_Huang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yilin_Yang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yiying_Li
>
swrc:
pages
89-93
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mr/ZhangWHCCLHLYY16/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mr/ZhangWHCCLHLYY16
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mr/mr67.html#ZhangWHCCLHLYY16
>
rdfs:
seeAlso
<
https://doi.org/10.1016/j.microrel.2016.10.015
>
dc:
title
Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
67
(xsd:string)