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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/ZhouPCZ11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Albert_Pang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jianhua_Zhou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shichang_Zou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Steam_Cao>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2011.04.004>
foaf:homepage <https://doi.org/10.1016/j.microrel.2011.04.004>
dc:identifier DBLP journals/mr/ZhouPCZ11 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2011.04.004 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Hole tunneling from valence band and hot-carrier induced hysteresis effect in 0.13 őľm partially depleted silicon-on-insulator n-MOSFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Albert_Pang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jianhua_Zhou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shichang_Zou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Steam_Cao>
swrc:number 12 (xsd:string)
swrc:pages 2077-2080 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/ZhouPCZ11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/ZhouPCZ11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr51.html#ZhouPCZ11>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2011.04.004>
dc:title Hole tunneling from valence band and hot-carrier induced hysteresis effect in 0.13 őľm partially depleted silicon-on-insulator n-MOSFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 51 (xsd:string)