[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/ZhuFRAK13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Alaeddine>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Blaise_Ravelo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fran%E2%88%9A%C3%9Fois_Fouquet>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jian-Zhi_Zhu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Moncef_Kadi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2013.07.077>
foaf:homepage <https://doi.org/10.1016/j.microrel.2013.07.077>
dc:identifier DBLP journals/mr/ZhuFRAK13 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2013.07.077 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Experimental investigation of Zener diode reliability under pulsed Electrical Overstress (EOS). (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Alaeddine>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Blaise_Ravelo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fran%E2%88%9A%C3%9Fois_Fouquet>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jian-Zhi_Zhu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Moncef_Kadi>
swrc:number 9-11 (xsd:string)
swrc:pages 1288-1292 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/ZhuFRAK13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/ZhuFRAK13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr53.html#ZhuFRAK13>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2013.07.077>
dc:title Experimental investigation of Zener diode reliability under pulsed Electrical Overstress (EOS). (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 53 (xsd:string)