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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/pami/DarwishJ88>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ahmed_M._Darwish_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anil_K._Jain_0002>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F34.3867>
foaf:homepage <https://doi.org/10.1109/34.3867>
dc:identifier DBLP journals/pami/DarwishJ88 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F34.3867 (xsd:string)
dcterms:issued 1988 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/pami>
rdfs:label A Rule Based Approach for Visual Pattern Inspection. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ahmed_M._Darwish_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anil_K._Jain_0002>
swrc:number 1 (xsd:string)
swrc:pages 56-68 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/pami/DarwishJ88/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/pami/DarwishJ88>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/pami/pami10.html#DarwishJ88>
rdfs:seeAlso <https://doi.org/10.1109/34.3867>
dc:subject computer vision; image interpretation; region labelling; morphological techniques; feature extraction; PCB defect detection; rule based approach; visual pattern inspection; bilevel image segmentation; shape inspection; scene-specific knowledge; rule verification; printed circuit boards; computer vision; computerised pattern recognition; computerised picture processing; inspection; knowledge engineering (xsd:string)
dc:title A Rule Based Approach for Visual Pattern Inspection. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 10 (xsd:string)