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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/pami/StanfordR00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adrian_E._Raftery>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Derek_C._Stanford>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F34.862198>
foaf:homepage <https://doi.org/10.1109/34.862198>
dc:identifier DBLP journals/pami/StanfordR00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F34.862198 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/pami>
rdfs:label Finding Curvilinear Features in Spatial Point Patterns: Principal Curve Clustering with Noise. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adrian_E._Raftery>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Derek_C._Stanford>
swrc:number 6 (xsd:string)
swrc:pages 601-609 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/pami/StanfordR00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/pami/StanfordR00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/pami/pami22.html#StanfordR00>
rdfs:seeAlso <https://doi.org/10.1109/34.862198>
dc:subject Bayes factor, BIC, CEM algorithm, earthquake, EM algorithm, Hough transform, model-based clustering, smoothing, spatial point process, visual defect metrology. (xsd:string)
dc:title Finding Curvilinear Features in Spatial Point Patterns: Principal Curve Clustering with Noise. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 22 (xsd:string)