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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/pami/StokelyW92>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ernest_M._Stokely>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shang_You_Wu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F34.149594>
foaf:homepage <https://doi.org/10.1109/34.149594>
dc:identifier DBLP journals/pami/StokelyW92 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F34.149594 (xsd:string)
dcterms:issued 1992 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/pami>
rdfs:label Surface Parametrization and Curvature Measurement of Arbitrary 3-D Objects: Five Practical Methods. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ernest_M._Stokely>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shang_You_Wu>
swrc:number 8 (xsd:string)
swrc:pages 833-840 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/pami/StokelyW92/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/pami/StokelyW92>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/pami/pami14.html#StokelyW92>
rdfs:seeAlso <https://doi.org/10.1109/34.149594>
dc:subject 3D images; curvature sampling; picture processing; shape recognition; curvature measurement; surface patch parameterization; Sander-Zucker approach; direct surface mapping; piecewise linear manifold technique; turtle geometry method; cross patch; pattern recognition; picture processing (xsd:string)
dc:title Surface Parametrization and Curvature Measurement of Arbitrary 3-D Objects: Five Practical Methods. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 14 (xsd:string)