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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/pieee/BrillouetBCHHIU10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adrian_M._Ionescu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/George_Bourianoff>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_A._Hutchby>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ken_Uchida>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michel_Brillou%E2%88%9A%C4%99t>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ralph_K._Cavin_III>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toshiro_Hiramoto>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FJPROC.2010.2061210>
foaf:homepage <https://doi.org/10.1109/JPROC.2010.2061210>
dc:identifier DBLP journals/pieee/BrillouetBCHHIU10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FJPROC.2010.2061210 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/pieee>
rdfs:label Regional, National, and International Nanoelectronics Research Programs: Topical Concentration and Gaps. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adrian_M._Ionescu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/George_Bourianoff>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_A._Hutchby>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ken_Uchida>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michel_Brillou%E2%88%9A%C4%99t>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ralph_K._Cavin_III>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toshiro_Hiramoto>
swrc:number 12 (xsd:string)
swrc:pages 1993-2004 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/pieee/BrillouetBCHHIU10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/pieee/BrillouetBCHHIU10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/pieee/pieee98.html#BrillouetBCHHIU10>
rdfs:seeAlso <https://doi.org/10.1109/JPROC.2010.2061210>
dc:title Regional, National, and International Nanoelectronics Research Programs: Topical Concentration and Gaps. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 98 (xsd:string)